Transforming SiC Inspection: Spirox & Southport Launch Cutting-Edge Tool

In an industry-first technological breakthrough, Spirox and Southport have announced the launch of JadeSiC-NK, a non-destructive inspection system for Silicon Carbide (SiC) substrates. This innovation represents a leap from the conventional destructive KOH etching method, offering a sustainable, efficient, and cost-effective solution for SiC substrate manufacturers.

Innovating SiC Substrates with JadeSiC-NK

Traditionally, the quality of SiC substrate materials has been inspected through sampling and mathematical interpolation using the destructive KOH etching method. JadeSiC-NK changes this approach. Not only does it enable a whole-wafer surface scan to a specific depth, but it also efficiently identifies key defects like BPD, TSD, MicroPipe, and Stacking Fault. Unlike optical technologies that only detect surface non-crystalline defects, JadeSiC-NK offers the advantage of detailed ingot analysis and batch traceability analysis, assisting in process and yield optimization.

The Benefits and Future of Non-Destructive Inspection

Implementing non-destructive inspection has multiple benefits. First, it significantly saves inspection time and substrate costs. Plus, it eliminates the need for harmful chemical solutions associated with KOH etching, implying a more eco-friendly process. Spirox, after launching JadeSiC-NK, plans to accelerate the commercialization of advanced optical inspection technologies and expand to other domains, such as MicroLED, metamaterials, silicon photonics, and more.

Enhancing Taiwan’s Technological Leadership with Collaboration

This collaboration reflects Taiwan’s prowess in technological innovation. Ken Tai, Chairman of Taiwan Photonics Industry & Technology Development Association, says it’s a “great pleasure to see two Taiwanese companies creating synergy through a mutually beneficial collaboration.” He believes JadeSiC-NK is a revolutionary product for the growing global compound semiconductor industry, capable of reducing costs and enhancing production capacity while demonstrating Taiwan’s technological leadership.

In conclusion, the launch of JadeSiC-NK signals a new era for SiC substrate inspection. With its non-destructive nature, it promises increased efficiency, considerable cost savings, and a reduction in harmful chemical usage. This technological solution also represents Taiwan’s technological growth with collaboration between Spirox and Southport at the forefront, ushering future innovations in the tech industry.

Don’t miss our latest Startup News: Exploring Budget-Friendly Digital Services for Your Startup.

Photo of Alex


Alex is a seasoned editor and writer with a deep passion for technology and startups. With a background in journalism, content creation, and business development, Alex brings a wealth of experience and a unique perspective to the ever-changing world of innovation. As the lead editor at Startup World, Alex is committed to discovering the hidden gems in the startup ecosystem and sharing these exciting stories with a growing community of enthusiasts, entrepreneurs, and investors. Always eager to learn and stay updated on the latest trends, Alex frequently attends industry events and engages with thought leaders to ensure Startup World remains at the forefront of startup news and insights. Alex's dedication and expertise help create an engaging platform that fosters knowledge-sharing, inspiration, and collaboration among tech-savvy readers worldwide.

Related Articles

Leave a Reply

Your email address will not be published. Required fields are marked *

This site uses Akismet to reduce spam. Learn how your comment data is processed.

Back to top button